describe how we use V protocol aware solution to test a complex RF device. form reconstruction utilizes the coherency of V SOC system to. Download scientific diagram | Agilent SOC Series tester. from publication: Test engineering education in Europe: the EuNICE-Test project | The paper. Download scientific diagram | Agilent SOC Series Digital IC Test System from publication: Process Models for the Reconstruction of Software Architecture .
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Per-pin speed scalability from Mbps to Mbps provides the performance needed to test a wide range of interfaces, including USB2. This results in minimal measurement overhead and higher throughput.
Compatible with Agilent Ce-channels Protects agilrnt investment in equipment, people and training Additional Detail Up to pins The Pin Scale offers 32 pins per agilenr, which is twice the density of the Ce- and P-model agilenf cards. Product Summary Per-pin scalability up to Mbps High density digital card with per-pin scalability up to Mbps offers the lowest cost SOC test in production. Up to pins Support of multi-site for high pin count devices reduces cost-of-test.
The Pin Scale protects your investment through expanded scalability, which provides the performance needed to test a wide variety of devices now and into the future. Agilent Pin Scale Product Overview Industry Challenges Consumer demand for more capability and connectivity in a single product is driving the need for more functionality, faster processing and higher speed interfaces in next-generation System-on-a-Chip SOC and System-in-Package SIP devices.
Unified memory agient The entire amount of purchased memory is available for both test vectors and sequencer instructions for maximum flexibility. Provides performance for high speed interface test, such as DDR, operating over Mbps.
Provides performance headroom for the future, protecting your investment. Each pin of the Pin Scale can be scaled over its wide memory depth and speed range through per-pin software licenses, which provides the lowest cost of test by allowing the test system to be configured to match device requirements, pin-by-pin. The Pin Scale features a Test Processor-Per-Pin architecture, which allows all processing to occur locally in the card, and in parallel 9300 pins, providing maximum parallel efficiency.
Business Finance Agilent Pin Scale advertisement. For printed directions on Preparing for Registration. With per-pin licenses to enable the different speed and memory performance levels — part of the industry-first Agilent InstaPin performance library — the Pin Scale digital card can be configured to match the device requirements, pin-by-pin, resulting in the lowest agilenr of test.
Reconfiguration is done instantly when the test program is loaded, ensuring no downtime.
This flexibility can be especially important for embedded agilebt, microprocessor and protocol-based communications applications. Performance for next-generation SOC devices With digital speeds up to Mbps and memory up to MB X4 Mode on each pin, the Pin Scale delivers the performance demanded by next-generation devices. Unified memory approach The unified memory approach pools memory for both sequence instructions and vectors.
Test Processor-Per-Pin architecture Localizing all test processing instead of using centralized resources results in minimal measurement overhead and higher agilnt. And this must all be done at a lower costof-test than last year because of ongoing price erosion. The value of parallel test, however, depends on its efficiency. This unprecedented flexibility allows the Agilent to match the next device to be tested, instantly.
Flexible waveform generation for high-speed applications.
Because the reconfiguration is accomplished via software, no hardware is moved, which eliminates the need to recalibrate and eliminates the risk of hardware damage during movement.
Optional waveforms Provides greater timing flexibility for ease of programming. An uncertain future demands the ability to upgrade quickly to meet the next performance challenge while continuing to reduce cost-of-test. Each pin operates independently, enabling parallel processing for maximum multi-site efficiency.
Testing in higher x-modes means that more logical vector memory is available. This unmatched performance also enables testing of logic cores in a range of applications while maintaining headroom for increasing processing speeds. This enables the Agilent to offer the following 933000 counts: This lowers immediate capital investment and provides for future growth as devices evolve from generation to generation, integrating more high-speed interfaces or achieving higher processing speeds.
Agilent CE for sale / JMC Worldwide Inc.
Per-pin software licenses for speed and memory depth mean you add just the performance you need, when you need it. Agilent InstaPin also maximizes asset utilization because the per-pin licenses for speed and memory depth of Pin Scale digital cards can float between pins on a card, cards in a tester and testers on a test floor or different production facilities around the world.
The entire amount of purchased memory is available for both test vectors and sequencer instructions, which provides more flexibility than architectures based upon two unshared memory areas. Per-pin scalability from to Mbps The test system can be configured to match device requirements, pin-by-pin, for lowest cost.
Agilent 93000 Pin Scale 800
With 32 pins on the Pin Scale digital card, an Agilent can be configured with up to pins, providing the pin count needed for multi-site test of even high agilennt count devices. The Pin Scale offers broad scalability starting at Mbps for low cost, low performance needs and scaling to Mbps for higher performance demands — all with a single digital card. To test these devices, a test system must have the capability to address a range of performance challenges: Also beneficial to generate low jitter high-speed clock signals.
Documents Flashcards Grammar checker. In addition, each digital pin operates in parallel, maximizing multi-site efficiency.